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Prof. Faxian Xiu
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Topological Dirac Quantum Materials
Twisted Graphene Materials
Two-Dimensional Superconductors
Magnetic Heterostructures
Optoelectronic Detectors Based on Low-Dimensional Atomic Crystals
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Physical Property Characterization
Facilities
Physical Property Characterization
Sample Preparation
Physical Property Characterization
Electric Measurement System
Optical Flat
TeslatronPT 12T
Oxford He3 14T
Scanning Probe Mircoscope
Dynacool
Dilution refrigerator
Physical Property Measurement System(PPMS)